Omnidirectional reflection of electromagnetic waves on Thue-Morse dielectric multilayers

Abstract

We report here the reflection of electromagnetic waves in self-similar Thue-Morse dielectric multilayers, which presents the features of multiple omnidirectional photonic bandgaps (PBGs). The number and the width of omnidirectional PBG depend on the ratio of the refraction indexes and the thicknesses of the dielectric materials. The theoretical result is partly verified by optical observation in Thue-Morse TiO2/SiO2 multilayers with visible and near-infrared light. Our investigations provide a new approach to achieve the omnidirectional reflection in multiple frequency ranges. With this progress, the application of dielectric reflection mirrors can be further widened.