JOURNAL ARTICLE

Hydrogenation Effect on Mg∕Mn Multilayer Thin Films

M. K. JangidS.P. NehraManohar SinghAlka B. GargR. MittalR. Mukhopadhyay

Year: 2011 Journal:   AIP conference proceedings Pages: 685-686   Publisher: American Institute of Physics

Abstract

Multilayer Mg/Mn thin films have been prepared using thermal evaporation method at pressure 10−5 torr. Annealing of structure has been performed in atmospheric condition at 600 K constant temperature for one hour. Hydrogenation of annealed thin films has been performed by keeping these in hydrogenation cell at different hydrogen pressures for 30 min. The UV–VIS absorption spectra of thin films have been carried out at room temperature in the wavelength range of 300–800 nm. The optical band gap was found to be increase and conductivity has been found to be decreased with hydrogen pressure. Raman spectra of these sample shows decreasing intensity of peaks with hydrogenation.

Keywords:
Thin film Torr Materials science Analytical Chemistry (journal) Raman spectroscopy Annealing (glass) Hydrogen Spectral line Absorption spectroscopy Band gap Atmospheric pressure Chemistry Optics Optoelectronics Metallurgy Nanotechnology

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Citation History

Topics

Chalcogenide Semiconductor Thin Films
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
ZnO doping and properties
Physical Sciences →  Materials Science →  Materials Chemistry

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