Electro-optic property measurements of electrostatically self-assembled ultrathin films

Liangmin Zhang; Fajian Zhang; Kristie L. Cooper; Yongqiang Wang; Yanjing Liu; Richard O. Claus

doi:10.1016/s0030-4018(00)01064-6

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Electro-optic property measurements of electrostatically self-assembled ultrathin films

Liangmin Zhang Fajian Zhang Kristie L. Cooper Yongqiang Wang Yanjing Liu Richard O. Claus

Year: 2000 Journal: Optics Communications Vol: 186 (1-3)Pages: 135-141 Publisher: Elsevier BV

DOI: 10.1016/s0030-4018(00)01064-6

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Keywords:

Materials science Modulation (music) Optics Electric field Monolayer Electro-optic effect Optoelectronics Ellipsometry Thin film Nanotechnology Physics Acoustics

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Molecular Junctions and Nanostructures

Physical Sciences → Engineering → Electrical and Electronic Engineering

Quantum Dots Synthesis And Properties

Physical Sciences → Materials Science → Materials Chemistry

Optical Coatings and Gratings

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Electro-optic property measurements of electrostatically self-assembled ultrathin films

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