Ellipsometry of thin films of copper phthalocyanine

Martin Barrett; Z. Borkowska; M.W. Humphreys; Roger Parsons

doi:10.1016/0040-6090(75)90120-0

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Ellipsometry of thin films of copper phthalocyanine

Martin Barrett Z. Borkowska M.W. Humphreys Roger Parsons

Year: 1975 Journal: Thin Solid Films Vol: 28 (2)Pages: 289-302 Publisher: Elsevier BV

DOI: 10.1016/0040-6090(75)90120-0

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Keywords:

Isotropy Ellipsometry Materials science Layer (electronics) Anisotropy Substrate (aquarium) Thin film Surface roughness Surface finish Copper Homogeneous Deposition (geology) Optics Analytical Chemistry (journal) Composite material Chemistry Nanotechnology Metallurgy Thermodynamics Organic chemistry

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Copper-based nanomaterials and applications

Physical Sciences → Materials Science → Materials Chemistry

ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Optical Coatings and Gratings

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Ellipsometry of thin films of copper phthalocyanine

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