Structural properties of V2O5 thin films prepared by vacuum evaporation

R.T. Rajendra Kumar; B. Karunagaran; V. Senthil Kumar; Y.L. Jeyachandran; D. Mangalaraj; Sa. K. Narayandass

doi:10.1016/j.mssp.2003.08.017

ScienceGate Book Chapters

JOURNAL ARTICLE

Structural properties of V2O5 thin films prepared by vacuum evaporation

R.T. Rajendra Kumar B. Karunagaran V. Senthil Kumar Y.L. Jeyachandran D. Mangalaraj Sa. K. Narayandass

Year: 2003 Journal: Materials Science in Semiconductor Processing Vol: 6 (5-6)Pages: 543-546 Publisher: Elsevier BV

DOI: 10.1016/j.mssp.2003.08.017

Get Full-Text PDF Get Analytical Report

Keywords:

Materials science Lattice constant Crystallite Amorphous solid Orthorhombic crystal system Raman spectroscopy Thin film Pentoxide Analytical Chemistry (journal) Vacuum evaporation Vanadium Raman scattering Crystallography Crystal structure Diffraction Metallurgy Nanotechnology Optics

Metrics

Cited By

1.15

FWCI (Field Weighted Citation Impact)

Refs

0.75

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Transition Metal Oxide Nanomaterials

Physical Sciences → Materials Science → Polymers and Plastics

ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Electronic and Structural Properties of Oxides

Physical Sciences → Materials Science → Materials Chemistry

Structural properties of V2O5 thin films prepared by vacuum evaporation

Metrics

Citation History

Topics

Related Documents

Structural and optical properties of vacuum evaporated V2O5 thin films

Dielectric properties of Y2O3 thin films prepared by vacuum evaporation

Optical and structural properties of lead iodide thin films prepared by vacuum evaporation method

Structural and Optical Properties of Germanium Thin Films Prepared by the Vacuum Evaporation Technique

Structural and Optical Properties of Lead Iodide Thin Films Prepared By Vacuum Evaporation Method