JOURNAL ARTICLE

Structural properties of V2O5 thin films prepared by vacuum evaporation

R.T. Rajendra KumarB. KarunagaranV. Senthil KumarY.L. JeyachandranD. MangalarajSa. K. Narayandass

Year: 2003 Journal:   Materials Science in Semiconductor Processing Vol: 6 (5-6)Pages: 543-546   Publisher: Elsevier BV
Keywords:
Materials science Lattice constant Crystallite Amorphous solid Orthorhombic crystal system Raman spectroscopy Thin film Pentoxide Analytical Chemistry (journal) Vacuum evaporation Vanadium Raman scattering Crystallography Crystal structure Diffraction Metallurgy Nanotechnology Optics

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59
Cited By
1.15
FWCI (Field Weighted Citation Impact)
9
Refs
0.75
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Transition Metal Oxide Nanomaterials
Physical Sciences →  Materials Science →  Polymers and Plastics
ZnO doping and properties
Physical Sciences →  Materials Science →  Materials Chemistry
Electronic and Structural Properties of Oxides
Physical Sciences →  Materials Science →  Materials Chemistry
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