Semi-supervised metric learning via topology preserving multiple semi-supervised assumptions

Qianying Wang; Pong C. Yuen; Guocan Feng

doi:10.1016/j.patcog.2013.02.015

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Semi-supervised metric learning via topology preserving multiple semi-supervised assumptions

Qianying Wang Pong C. Yuen Guocan Feng

Year: 2013 Journal: Pattern Recognition Vol: 46 (9)Pages: 2576-2587 Publisher: Elsevier BV

DOI: 10.1016/j.patcog.2013.02.015

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Keywords:

Margin (machine learning) Metric (unit) Semi-supervised learning Smoothness Mathematics Supervised learning Manifold (fluid mechanics) Artificial intelligence Pattern recognition (psychology) Nonlinear dimensionality reduction Topology (electrical circuits) Computer science Algorithm Machine learning Artificial neural network

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Face and Expression Recognition

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Video Surveillance and Tracking Methods

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Advanced Image and Video Retrieval Techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition

Semi-supervised metric learning via topology preserving multiple semi-supervised assumptions

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