JOURNAL ARTICLE

Semi-supervised metric learning via topology preserving multiple semi-supervised assumptions

Qianying WangPong C. YuenGuocan Feng

Year: 2013 Journal:   Pattern Recognition Vol: 46 (9)Pages: 2576-2587   Publisher: Elsevier BV
Keywords:
Margin (machine learning) Metric (unit) Semi-supervised learning Smoothness Mathematics Supervised learning Manifold (fluid mechanics) Artificial intelligence Pattern recognition (psychology) Nonlinear dimensionality reduction Topology (electrical circuits) Computer science Algorithm Machine learning Artificial neural network

Metrics

52
Cited By
4.94
FWCI (Field Weighted Citation Impact)
56
Refs
0.96
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Face and Expression Recognition
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Video Surveillance and Tracking Methods
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Advanced Image and Video Retrieval Techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition

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