Ion Desorption from Single-Walled Carbon Nanotubes Induced by Soft X-ray Illumination

Abstract

We have investigated ion desorption from single-walled carbon nanotubes (SWNTs) that is induced by soft X-ray illumination in the C 1s core-excitation energy range in order to have insight to the mechanism of defect formation caused by the similar excitation. The mass of desorbed ions was analyzed by a time-of-flight (TOF) spectrometer and the photon energy dependence of the ion yield or the desorption efficiency spectra were measured as a function of the monochromatic photon energy used for illumination. Experimental results exclude the simple detachment of carbon atoms constituting the nanotubes from the cause of the defect formation. Also the photo-induced etching of carbon atoms associated with C–H bond rupture is ruled out from the defect formation mechanism. Auger mechanisms to explain the photo-induced desorption are discussed.