Optical, electrical and structural characterization of ZnO:Al thin films prepared by a low cost sol–gel method

M. Vishwas; K. Narasimha Rao; A.R. Phani; K.V. Arjuna Gowda; R.P.S. Chakradhar

doi:10.1016/j.ssc.2011.10.040

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Optical, electrical and structural characterization of ZnO:Al thin films prepared by a low cost sol–gel method

M. Vishwas K. Narasimha Rao A.R. Phani K.V. Arjuna Gowda R.P.S. Chakradhar

Year: 2011 Journal: Solid State Communications Vol: 152 (4)Pages: 324-327 Publisher: Elsevier BV

DOI: 10.1016/j.ssc.2011.10.040

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Keywords:

Materials science Annealing (glass) Thin film Sol-gel Band gap Crystallite Spin coating Electrical resistivity and conductivity Analytical Chemistry (journal) Doping Dielectric Silicon Optoelectronics Composite material Nanotechnology Metallurgy Chemistry Electrical engineering

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ZnO doping and properties

Physical Sciences → Materials Science → Materials Chemistry

Gas Sensing Nanomaterials and Sensors

Physical Sciences → Engineering → Electrical and Electronic Engineering

Copper-based nanomaterials and applications

Physical Sciences → Materials Science → Materials Chemistry

Optical, electrical and structural characterization of ZnO:Al thin films prepared by a low cost sol–gel method

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