JOURNAL ARTICLE

Relevance of length scales in exchange biased submicron dots

Z. P. LiR. MoralesIván K. Schuller

Year: 2009 Journal:   Applied Physics Letters Vol: 94 (14)   Publisher: American Institute of Physics

Abstract

Strong dot-size dependence of the positive exchange bias onset with the cooling field was found in Ni/FeF2 exchange biased nanostructures. With increasing cooling field, the sign of the exchange bias field changes from negative to coexistence of positive and negative, and eventually to positive. As the structure size decreases, the lower limit of cooling fields necessary for only positive exchange bias also decreases and is one order of magnitude smaller than that of unpatterned films. This behavior is attributed to comparable Ni dot size with the antiferromagnet “domain” size estimated to be about 500 nm.

Keywords:
Exchange bias Antiferromagnetism Condensed matter physics Field (mathematics) Materials science Sign (mathematics) Physics Magnetic field Magnetization Mathematics

Metrics

12
Cited By
1.57
FWCI (Field Weighted Citation Impact)
17
Refs
0.85
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Magnetic properties of thin films
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Copper Interconnects and Reliability
Physical Sciences →  Materials Science →  Electronic, Optical and Magnetic Materials
ZnO doping and properties
Physical Sciences →  Materials Science →  Materials Chemistry

Related Documents

JOURNAL ARTICLE

Reversal behavior of exchange-biased submicron dots

Z. P. LiO. PetracicJ. EisenmengerIván K. Schuller

Journal:   Applied Physics Letters Year: 2005 Vol: 86 (7)
JOURNAL ARTICLE

Vortex dynamics in submicron exchange‐biased disks

Jung Hwan MoonWoo Jin KimTaek Dong LeeKyung‐Jin Lee

Journal:   physica status solidi (b) Year: 2007 Vol: 244 (12)Pages: 4491-4494
JOURNAL ARTICLE

Lateral length scales in exchange bias

I. V RoshchinO PetracicR MoralesZ.-P LiX BatlleI. K Schuller

Journal:   Europhysics Letters (EPL) Year: 2005 Vol: 71 (2)Pages: 297-303
JOURNAL ARTICLE

Lateral length scales in exchange bias

I. V. RoshchinO. PetracicR. MoralesZ.-P. LiX. BatlleI. K. Schuller

Journal:   Springer Link (Chiba Institute of Technology) Year: ---
© 2026 ScienceGate Book Chapters — All rights reserved.