Visible photoluminescence of zinc oxide films electrochemically deposited on silicon substrates

Abstract

Continuous crystalline films of zinc oxide (ZnO) with thicknesses of 6-10 mu m were obtained by electrochemical deposition from aqueous zinc nitrate solutions on silicon substrates with a buffer nickel layer. X-ray diffraction measurements showed that the polycrystalline films possess a hexagonal crystal lattice with predominant (0002) orientation. The obtained ZnO films exhibit strong photoluminescence in the visible spectral range at room temperature.