JOURNAL ARTICLE

Molecular beam epitaxy of strained PbTe/EuTe superlattices

G. SpringholzG. Bauer

Year: 1993 Journal:   Applied Physics Letters Vol: 62 (19)Pages: 2399-2401   Publisher: American Institute of Physics

Abstract

Using reflection high energy electron diffraction (RHEED), the phase diagram of strained layer heteroepitaxy of EuTe by molecular beam epitaxy on PbTe(111) surfaces was determined. The EuTe(111) surface exhibits different surface reconstructions corresponding to a Te-stabilized or an Eu-stabilized surface state. For perfect two-dimensional layer-by-layer heteroepitaxial growth, only a narrow process window exists which can be determined by RHEED. Using such established growth conditions, we have fabricated strained PbTe/EuTe superlattices with superior structural perfection as shown by high resolution x-ray diffraction.

Keywords:
Reflection high-energy electron diffraction Molecular beam epitaxy Electron diffraction Superlattice Materials science Diffraction Layer (electronics) Reflection (computer programming) Superstructure Optics Epitaxy Crystallography Condensed matter physics Optoelectronics Chemistry Nanotechnology Physics

Metrics

50
Cited By
5.06
FWCI (Field Weighted Citation Impact)
9
Refs
0.96
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced Semiconductor Detectors and Materials
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor Quantum Structures and Devices
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Quantum Dots Synthesis And Properties
Physical Sciences →  Materials Science →  Materials Chemistry

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