Thermoelectric figure of merit for semiconductor submicron layers

G. N. Logvinov

doi:10.1007/bf00558999

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Thermoelectric figure of merit for semiconductor submicron layers

G. N. Logvinov

Year: 1993 Journal: Russian Physics Journal Vol: 36 (9)Pages: 870-873 Publisher: Springer Science+Business Media

DOI: 10.1007/bf00558999

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Keywords:

Figure of merit Semiconductor Thermoelectric effect Materials science Condensed matter physics Isothermal process Thermal conductivity Thermoelectric materials Heat flux Thermodynamics Optoelectronics Physics Heat transfer Composite material

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Advanced Semiconductor Detectors and Materials

Physical Sciences → Engineering → Electrical and Electronic Engineering

Thermography and Photoacoustic Techniques

Physical Sciences → Engineering → Mechanics of Materials

Thermodynamic and Structural Properties of Metals and Alloys

Physical Sciences → Engineering → Mechanical Engineering

Thermoelectric figure of merit for semiconductor submicron layers

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