Shizuo TokitoHiromitsu TanakaK. NodaAkane OkadaYasunori Taga
Thermal stability of the electroluminescent (EL) devices using various hole-transporting materials based on triphenylamine, and a typical emitting material, tris(8-quinolinolato) aluminum has been systematically studied. The thermal stability of the EL devices is clearly seen to depend on the glass transition temperature (Tg) of the hole-transporting material. The highest thermal stability up to 155 °C is obtained in the device using the pentamer of triphenylamine. It has been found that the linear linkage of triphenylamine is useful to attain high Tg rather than the branch linkage.
Yuguang MaJianguo TangShiyong LiuRuifeng ZhangJiacong Shen
Eryun YanZonghao HuangYi XinQiang ZhaoWen Zhang
Dong-Wan RyuKyoung-Soo KimCheol‐Kyu ChoiYoungil ParkIn‐Nam KangJongwook Park
T. Del CañoKeisuke HashimotoHiroshi KageyamaJ.A. de SajaRicardo F. ArocaYutaka OhmoriYasuhiko Shirota