Microstructure and magnetic properties of sputtered CoSm/Cr thin films with high coercivities

Yoshinobu Okumura; Osamu Suzuki; H. Morita; Xingbo Yang; H. Fujimori

doi:10.1016/0304-8853(94)01684-4

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Microstructure and magnetic properties of sputtered CoSm/Cr thin films with high coercivities

Yoshinobu Okumura Osamu Suzuki H. Morita Xingbo Yang H. Fujimori

Year: 1995 Journal: Journal of Magnetism and Magnetic Materials Vol: 146 (1-2)Pages: 5-12 Publisher: Elsevier BV

DOI: 10.1016/0304-8853(94)01684-4

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Keywords:

Microstructure Materials science Amorphous solid Transmission electron microscopy High-resolution transmission electron microscopy Thin film Anisotropy Condensed matter physics Composite material Crystallography Optics Nanotechnology Chemistry Physics

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Magnetic properties of thin films

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Magnetic Properties of Alloys

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Magnetic Properties and Applications

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Microstructure and magnetic properties of sputtered CoSm/Cr thin films with high coercivities

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