Stress analysis, structure and magnetic properties of sputter deposited Ni–Mn–Ga ferromagnetic shape memory thin films

A. Annadurai; M. Manivel Raja; K. Prabahar; Atul Kumar; M.D. Kannan; S. Jayakumar

doi:10.1016/j.jmmm.2011.06.017

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Stress analysis, structure and magnetic properties of sputter deposited Ni–Mn–Ga ferromagnetic shape memory thin films

A. Annadurai M. Manivel Raja K. Prabahar Atul Kumar M.D. Kannan S. Jayakumar

Year: 2011 Journal: Journal of Magnetism and Magnetic Materials Vol: 323 (22)Pages: 2797-2801 Publisher: Elsevier BV

DOI: 10.1016/j.jmmm.2011.06.017

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Keywords:

Materials science Thin film Residual stress Coercivity Sputtering Ferromagnetism Sputter deposition Annealing (glass) Composite material Nuclear magnetic resonance Condensed matter physics Nanotechnology

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Shape Memory Alloy Transformations

Physical Sciences → Materials Science → Materials Chemistry

High Entropy Alloys Studies

Physical Sciences → Engineering → Mechanical Engineering

Welding Techniques and Residual Stresses

Physical Sciences → Engineering → Mechanical Engineering

Stress analysis, structure and magnetic properties of sputter deposited Ni–Mn–Ga ferromagnetic shape memory thin films

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