Tetsuro TamuraHiromasa HokoY. ArimotoHiroshi Ishiwara
Abstract Fabrication of perovskite ferroelectric thin films by sol-gel technique with addition of silicates has been reported as the silicates enhance the crystallization and prevent the degradation of electric properties by reducing thickness [Citation1]. This technique is essential to realize high density, high speed and low voltage ferroelectric memories. In this report, we investigated silicate doping to sol-gel Pb(Zr,Ti)O3 films which is used in current devices. Keywords: PZTthin filmsol-gelferroelectric memory
E. O. KlebanskiiA. Yu. KudzinV. M. Pasal’skiiS. N. PlyakaL. Ya. SadovskayaG. Kh. Sokolyanskii
Ahmet Yavuz OralMehmet AslanZehra Banu BAHŞİ ORALE. Başaran
E. MouchonLisa C. KleinV. PicardM. Greenblatt
Kelly D. SimmonsG. I. StegemanB. G. PotterJoseph H. Simmons
Hongen NianSung Hong HahnKee‐Kahb KooEun Woo ShinEui Jung Kim