Structural properties of thermal evaporated SnTe thin films

G. Burrafato; S. O. Troja; E Turrisi; Giovanni Marletta; A. Torrisi

doi:10.1007/bf02450135

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Structural properties of thermal evaporated SnTe thin films

G. Burrafato S. O. Troja E Turrisi Giovanni Marletta A. Torrisi

Year: 1988 Journal: Il Nuovo Cimento D Vol: 10 (4)Pages: 463-471 Publisher: Springer Nature

DOI: 10.1007/bf02450135

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Keywords:

Materials science Thin film Photoemission spectroscopy Diffraction Spectroscopy Valence band Electrical resistivity and conductivity Condensed matter physics Valence (chemistry) Electron diffraction Angle-resolved photoemission spectroscopy Thermal Transmission electron microscopy Hall effect X-ray photoelectron spectroscopy Electronic structure Band gap Nuclear magnetic resonance Optics Nanotechnology Optoelectronics Chemistry Physics

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Structural properties of thermal evaporated SnTe thin films

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