A 180-nm CMOS time-of-flight 3-D image sensor

G.‐F. Dalla Betta; L. Pancheri; David Stoppa; Silvano Donati; Giuseppe Martini; G. Verzellesi

doi:10.1109/wio.2010.5582487

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A 180-nm CMOS time-of-flight 3-D image sensor

G.‐F. Dalla Betta L. Pancheri David Stoppa Silvano Donati Giuseppe Martini G. Verzellesi

Year: 2010 Vol: 40 Pages: 1-3

DOI: 10.1109/wio.2010.5582487

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Abstract

We report on the design and the experimental characterization of a new 3-D image sensor, based on a new 180-nm CMOS-compatible photo-detector, which features an internal demodulation mechanism effective up to high frequencies. The distance range covered by our proof-of-concept device spans from 1 m to a few meters, and the resolution is about 1 cm.

Keywords:

CMOS Demodulation Image sensor Detector CMOS sensor Image resolution Metre Computer science Optics Electronic engineering Optoelectronics Physics Engineering Telecommunications

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Advanced Optical Sensing Technologies

Physical Sciences → Physics and Astronomy → Instrumentation

CCD and CMOS Imaging Sensors

Physical Sciences → Engineering → Electrical and Electronic Engineering

Advanced Fluorescence Microscopy Techniques

Life Sciences → Biochemistry, Genetics and Molecular Biology → Biophysics

A 180-nm CMOS time-of-flight 3-D image sensor

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