JOURNAL ARTICLE
Direct sampling time-of-flight mass spectrometers for technological analysis
Alexander A. SysoevА. А. СысоевS. S. PoteshinV. I. PyatakhinI. V. ShchekinaА. С. Трофимов
Year: 1998 Journal: Fresenius Journal of Analytical Chemistry Vol: 361 (3)Pages: 261-266 Publisher: Springer Science+Business Media
Keywords:
Reflectron Mass spectrometry Time of flight Sampling (signal processing) Analytical Chemistry (journal) Spectrometer DART ion source Spectrum analyzer Time-of-flight mass spectrometry Ionization Data acquisition Resolution (logic) Electron ionization Chemistry Computer science Optics Physics Chromatography Ion
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Citation History
Topics
Mass Spectrometry Techniques and Applications
Physical Sciences → Chemistry → Spectroscopy
Analytical chemistry methods development
Physical Sciences → Chemistry → Analytical Chemistry
Nuclear Physics and Applications
Physical Sciences → Physics and Astronomy → Radiation