JOURNAL ARTICLE

Thick Film Circuits: Present State and Future Development

James A. Novotny

Year: 1981 Journal:   Active and Passive Electronic Components Vol: 9 (2)Pages: 131-137   Publisher: Hindawi Publishing Corporation

Abstract

Thick film technology has been known for about 20 years. The technique of inks, printing, firing and trimming has grown in this time to a well established state of the art. This paper gives an overview of the status today and an outlook into the future, not only for thick film, but also for hybrids built out of thick film circuits with incorporation of additional components. The paper gives the main market figures and market segments for thick film applications and mentions the main reasons for this. New fields of applications for thick film will be found in the future where considerations like reliability, space savings and cost advantage are of importance.

Keywords:
Trimming Electronic circuit Reliability (semiconductor) State (computer science) Computer science Engineering physics Electrical engineering Materials science Nanotechnology Engineering Mechanical engineering Physics

Metrics

0
Cited By
0.00
FWCI (Field Weighted Citation Impact)
0
Refs
0.19
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Electrical and Thermal Properties of Materials
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

Related Documents

JOURNAL ARTICLE

Thick film circuits: present state and future development

Journal:   Microelectronics Journal Year: 1983 Vol: 14 (4)Pages: 62-62
JOURNAL ARTICLE

Thick film circuits: present state and future development

Journal:   Microelectronics Reliability Year: 1982 Vol: 22 (6)Pages: 1194-1194
JOURNAL ARTICLE

Thick-film sensors: past, present and future

N.M. WhiteJ. David Turner

Journal:   Measurement Science and Technology Year: 1997 Vol: 8 (1)Pages: 1-20
JOURNAL ARTICLE

Thick-film circuits

G.W.A.D.

Journal:   Microelectronics Reliability Year: 1973 Vol: 12 (1)Pages: 31-31
JOURNAL ARTICLE

Thick film circuits

Journal:   Microelectronics Reliability Year: 1974 Vol: 13 (3)Pages: 170-170
© 2026 ScienceGate Book Chapters — All rights reserved.