Electronic processes in slow ion-surface collisions. Xe+ with clean and cesiated W(110) surfaces

A. Niehaus

doi:10.1016/0301-0104(93)e0350-5

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Electronic processes in slow ion-surface collisions. Xe+ with clean and cesiated W(110) surfaces

A. Niehaus

Year: 1994 Journal: Chemical Physics Vol: 179 (2)Pages: 183-190 Publisher: Elsevier BV

DOI: 10.1016/0301-0104(93)e0350-5

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Keywords:

Chemistry Auger Ion Atomic physics Auger electron spectroscopy Spectral line Work function Electron Monolayer Projectile Electron capture Atomic electron transition Auger effect Metal Physics Nuclear physics

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Topics

Atomic and Molecular Physics

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Electron and X-Ray Spectroscopy Techniques

Physical Sciences → Materials Science → Surfaces, Coatings and Films

X-ray Spectroscopy and Fluorescence Analysis

Physical Sciences → Physics and Astronomy → Radiation

Electronic processes in slow ion-surface collisions. Xe+ with clean and cesiated W(110) surfaces

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