This paper reviews thin film transistor technology with a detailed emphasis on amorphous silicon (a-Si:H) devices. The fabrication and large area technology issues are described. The materials parameters that affect device performance are dominated by interface effects and the gate dielectric. The problem of characterizing the interfaces is discussed. Applications in liquid crystal displays (LCD) and image sensors are described. It is concluded that there is considerable promise for this rapidly expanding technology.
Di GengKai WangLing LiKris MynyArokia NathanJin JangYue KuoMing Liu
Christos DimitrakopoulosPatrick R. L. Malenfant
Mohammad R. Esmaeili-RadHYUN JUNG LEEAndrei SazonovArokia Nathan
Mohammad R. Esmaeili-RadHyun Jung LeeAndrei SazonovArokia Nathan