JOURNAL ARTICLE

Deep Energy Levels of Platinum-Hydrogen Complexes in Silicon

Elie BadrP. PichlerG. Schmidt

Year: 2013 Journal:   Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena Vol: 205-206 Pages: 260-264   Publisher: Scientific.net

Abstract

Hydrogen incorporated into the samples by wet chemical etching interacts with platinum and forms several energy levels in the silicon forbidden band gap. Deep-level transient spectroscopy (DLTS) on Schottky diodes reveals several platinum-hydrogen related levels in p - and n -type silicon. In the n -type silicon, two new platinum-hydrogen related levels at 0.28 and 0.41 eV below the conduction band are reported. Annealing at 377 °C results in the dissociation of their corresponding platinum-hydrogen complexes.

Keywords:
Platinum Materials science Hydrogen Silicon Deep-level transient spectroscopy Dissociation (chemistry) Schottky diode Annealing (glass) Band gap Analytical Chemistry (journal) Diode Optoelectronics Physical chemistry Chemistry Catalysis Metallurgy Organic chemistry

Metrics

3
Cited By
0.36
FWCI (Field Weighted Citation Impact)
7
Refs
0.67
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Silicon and Solar Cell Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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