&lt;title&gt;Optical sampling measuring of optical and electrical waveform with picosecond resolution&lt;/title&gt;

V. Karaganov; D. V. Kolomoitsev; V. A. Komov; E.L. Portnoi; N. M. Siniavsky; A. Chelnokov

doi:10.1117/12.131864

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<title>Optical sampling measuring of optical and electrical waveform with picosecond resolution</title>

V. Karaganov D. V. Kolomoitsev V. A. Komov E.L. Portnoi N. M. Siniavsky A. Chelnokov

Year: 1992 Journal: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 1842 Pages: 119-123 Publisher: SPIE

DOI: 10.1117/12.131864

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Abstract

Cross-correlation method of measuring the optical and electrical waveforms with picosecond time resolution is reported. Sampling pulses (duration 5 - 15 ps) were generated by injection AlGaAs laser. Electro-optical Pockels effect was used for electrical measurements, and sum- frequency generation was used for optical measurements.

Keywords:

Pockels effect Picosecond Waveform Resolution (logic) Sampling (signal processing) Optics Materials science Laser Optoelectronics Physics Voltage Computer science

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Terahertz technology and applications

Physical Sciences → Engineering → Electrical and Electronic Engineering

Spectroscopy and Laser Applications

Physical Sciences → Chemistry → Spectroscopy

Photonic and Optical Devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

<title>Optical sampling measuring of optical and electrical waveform with picosecond resolution</title>

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