JOURNAL ARTICLE

Direct patterning of Si(001) surfaces by atomic manipulation

C. T. Salling

Year: 1996 Journal:   Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Vol: 14 (2)Pages: 1322-1326   Publisher: American Institute of Physics

Abstract

The ability to create atomic-scale structures with the scanning tunneling microscope (STM) plays an important role in the development of a future nanoscale technology. I briefly review the various modes of STM-based fabrication and atomic manipulation. I focus on using an ultrahigh vacuum STM to directly pattern the Si(001) surface by atomic manipulation at room temperature. By carefully adjusting the tip morphology and pulse voltage, a single atomic layer can be removed from the sample surface to define features one atom deep. Segments of individual dimer rows can be removed to create structures with atomically straight edges and with lateral features as small as one dimer wide. Trenches ∼3 nm wide and 2–3 atomic layers deep can be created with less stringent control of patterning parameters. Direct patterning provides a straightforward route to the fabrication of nanoscale test structures under ultrahigh vacuum conditions of cleanliness.

Keywords:
Fabrication Scanning tunneling microscope Nanoscopic scale Atomic units Nanotechnology Materials science Atom (system on chip) Nanowire Optoelectronics Dimer Lithography Chemistry Computer science Physics

Metrics

12
Cited By
1.40
FWCI (Field Weighted Citation Impact)
0
Refs
0.81
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Surface and Thin Film Phenomena
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Advanced Electron Microscopy Techniques and Applications
Life Sciences →  Biochemistry, Genetics and Molecular Biology →  Structural Biology

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