JOURNAL ARTICLE
Dielectric breakdown study of thin La2O3 films
Year: 1983 Journal: Thin Solid Films Vol: 105 (2)Pages: 163-168 Publisher: Elsevier BV
Keywords:
Dielectric strength Dielectric Materials science Capacitor Composite material Amorphous solid Thin film Impact ionization Electrical breakdown Ionization Condensed matter physics Chemistry Electrical engineering Optoelectronics Ion Nanotechnology Physics Voltage Engineering Crystallography
Metrics
13
Cited By
0.48
FWCI (Field Weighted Citation Impact)
25
Refs
0.68
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Semiconductor materials and devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
Copper Interconnects and Reliability
Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials
High voltage insulation and dielectric phenomena
Physical Sciences → Materials Science → Materials Chemistry
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