JOURNAL ARTICLE

An Integrated Compact Unit for Wide Range Micro-Newton Force Measurement

M. A. Salam AkandaHironori TohmyohMasumi SAKA

Year: 2010 Journal:   Journal of Solid Mechanics and Materials Engineering Vol: 4 (4)Pages: 545-556   Publisher: Japan Society Mechanical Engineers

Abstract

Wide range compact sensor is preferably sought for force sensing in testing of micro objects or local area of macro objects with the observation of high resolution microscope. This paper presents the design and development of an integrated passive cantilever type force sensing unit with the specificities of range variation, interchangeability of components and compact size by incorporating with cantilever, probe and a capacitive sensor for measurement of large range micro-newton forces in wide scope of application. In the design, the tactile force at the probe perpendicularly attached to the cantilever is converted as cantilever deflection, which is measured by the capacitive sensor. In connection to a tiny capacitive sensor a compatible cantilever with double-beam structure is considered. Cantilever length variation facility is incorporated in the unit for obtaining different force measurement ranges by using the same cantilever. Characterization of the cantilever is performed against a standard load cell. The force resolution with a typical cantilever is estimated as 10 nN. The elastic property of human hair is efficiently determined by testing with the combination of a digital microscope and the developed sensor system. The utility of the unit for different resolution/range by the interchangeability of cantilevers is also demonstrated. Experimental results show that this integrated force sensing unit achieves good sensitivity and linearity, and wide measurement range.

Keywords:
Cantilever Capacitive sensing Linearity Materials science Deflection (physics) Interchangeability Atomic force acoustic microscopy Acoustics Magnetic force microscope Optics Electronic engineering Electrical engineering Mechanical engineering Engineering Physics

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Citation History

Topics

Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Mechanical and Optical Resonators
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Advanced MEMS and NEMS Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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