JOURNAL ARTICLE

X-Ray Diffraction Microstructural Characterization of PZT (Pb(Zr<sub>x</sub>Ti<sub>1-x</sub>)O<sub>3</sub> and Pt Thin Films on TiN/Ti/BPSG/Si Structures

Françoise VarnièreB. Ea KimR. BisaroG. Chevrier

Year: 1996 Journal:   Materials science forum Vol: 228-231 Pages: 487-492   Publisher: Trans Tech Publications
Keywords:
Materials science X-ray crystallography Characterization (materials science) Diffraction X-ray Crystallography Microstructure Analytical Chemistry (journal) Metallurgy Nanotechnology Optics Physics Chemistry

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Topics

Metal and Thin Film Mechanics
Physical Sciences →  Engineering →  Mechanics of Materials
Advanced ceramic materials synthesis
Physical Sciences →  Materials Science →  Ceramics and Composites
Ferroelectric and Piezoelectric Materials
Physical Sciences →  Materials Science →  Materials Chemistry

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