JOURNAL ARTICLE

Size control of erbium-doped silicon nanocrystals

John St. JohnJeffery L. CofferYandong ChenRussell F. Pinizzotto

Year: 2000 Journal:   Applied Physics Letters Vol: 77 (11)Pages: 1635-1637   Publisher: American Institute of Physics

Abstract

This work describes the effects of pyrolysis oven length and erbium precursor on the preparation of discrete erbium-doped silicon nanoparticles. These doped nanoparticles were prepared by the co-pyrolysis of disilane and the volatile complex Er(tmhd)3 (tmhd=2,2,6,6-tetramethyl-3,5-heptanedionato). The particle sizes and size distributions were determined using high resolution and conventional transmission electron microscopy. Erbium-doped silicon nanoparticles exhibit a selected area electron diffraction pattern consistent with the diamond cubic phase and a distinctive dark contrast in the transmission electron microscope. The presence of erbium is confirmed by x-ray energy dispersive spectroscopy. In general, the mean diameter of the individual nanoparticles increases as the length of the pyrolysis oven used during their preparation is increased.

Keywords:
Erbium Silicon Materials science Transmission electron microscopy Doping Nanoparticle Particle size Analytical Chemistry (journal) Pyrolysis Diamond cubic Scanning electron microscope Nanotechnology Diamond Chemical engineering Optoelectronics Chemistry Physical chemistry Composite material Organic chemistry

Metrics

39
Cited By
1.85
FWCI (Field Weighted Citation Impact)
11
Refs
0.84
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Silicon Nanostructures and Photoluminescence
Physical Sciences →  Materials Science →  Materials Chemistry
Nanowire Synthesis and Applications
Physical Sciences →  Engineering →  Biomedical Engineering
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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