Microwave Reflectometry for Plasma Diagnostics

Abstract

Microwave reflectometry is a plasma diagnostic that launches microwaves to a plasma and measures the wave reflected at a cutoff layer in the plasma. It is used mainly for density profile and density fluctuation measurements. Because of its high radial resolution, high sensitivity, and relatively easy implementation, microwave reflectometry has been used in many devices. In this report, highlights of the measurements, as well as the features of reflectometry, are described.