Optical constants of tin-telluride determined from infrared interference spectra

D. Siapkas; D. B. Kushev; N.N. Zheleva; J. Siapkas; I. Lelidis

doi:10.1016/0020-0891(91)90019-c

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Optical constants of tin-telluride determined from infrared interference spectra

D. Siapkas D. B. Kushev N.N. Zheleva J. Siapkas I. Lelidis

Year: 1991 Journal: Infrared Physics Vol: 31 (5)Pages: 425-433 Publisher: Pergamon Press

DOI: 10.1016/0020-0891(91)90019-c

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Keywords:

Interference (communication) Materials science Envelope (radar) Optics Maxima and minima Spectral line Substrate (aquarium) Tin Reflectivity Infrared Layer (electronics) Molecular physics Optoelectronics Physics Nanotechnology Computer science

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Phase-change materials and chalcogenides

Physical Sciences → Materials Science → Materials Chemistry

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Advanced Semiconductor Detectors and Materials

Physical Sciences → Engineering → Electrical and Electronic Engineering

Optical constants of tin-telluride determined from infrared interference spectra

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