JOURNAL ARTICLE
Optical characterization of vacuum evaporated a-Se80Te20−xCux thin films
Anis Atikah AhmadShamshad A. KhanKirti SinhaLokendra KumarZishan H. KhanM. ZulfequarM. Husain
Year: 2007 Journal: Vacuum Vol: 82 (6)Pages: 608-612 Publisher: Elsevier BV
Keywords:
Molar absorptivity Thin film Refractive index Transmittance Absorbance Band gap Vacuum evaporation Amorphous solid Materials science Photon energy Optics Wavelength Vacuum deposition Analytical Chemistry (journal) Photon Chemistry Optoelectronics Crystallography Nanotechnology Physics
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27
Cited By
0.71
FWCI (Field Weighted Citation Impact)
19
Refs
0.69
Citation Normalized Percentile
Is in top 1%
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Citation History
Topics
Phase-change materials and chalcogenides
Physical Sciences → Materials Science → Materials Chemistry
Chalcogenide Semiconductor Thin Films
Physical Sciences → Engineering → Electrical and Electronic Engineering
Nonlinear Optical Materials Studies
Physical Sciences → Engineering → Biomedical Engineering
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