A Complex Permittivity Measurement Technique for High Dielectric Constant Materials at Microwave Frequency

Abstract

The measurement uncertainty of traditional transmission/reflection method is very poor for high dielectric constant (>100) materials or sample whose thickness was several integer multiples of half wavelength. A modified calculating procedure was presented for measuring the high dielectric constant materials. The method is based on the thickness resonance when electromagnetic wave is transmitting through transmission line filled with the sample. It is convenient for complex permittivity measurement of high dielectric constant materials with transmission/reflection method.