YSZ thin films deposited by e-beam technique

Giedrius Laukaitis; J. Dudonis; D. Milčius

doi:10.1016/j.tsf.2005.12.242

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YSZ thin films deposited by e-beam technique

Giedrius Laukaitis J. Dudonis D. Milčius

Year: 2006 Journal: Thin Solid Films Vol: 515 (2)Pages: 678-682 Publisher: Elsevier BV

DOI: 10.1016/j.tsf.2005.12.242

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Keywords:

Materials science Thin film Crystallite Yttria-stabilized zirconia Scanning electron microscope Substrate (aquarium) Crystallinity Texture (cosmology) Tetragonal crystal system Ceramic Composite material Crystallography Crystal structure Metallurgy Cubic zirconia Nanotechnology Chemistry

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High-Temperature Coating Behaviors

Physical Sciences → Engineering → Aerospace Engineering

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Electronic and Structural Properties of Oxides

Physical Sciences → Materials Science → Materials Chemistry

YSZ thin films deposited by e-beam technique

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