Ellipsometry for Thin-Film and Surface Analysis

Abstract

ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTEllipsometry for Thin-Film and Surface AnalysisRobert W. Collins and Yeon-Taik KimCite this: Anal. Chem. 1990, 62, 17, 887A–900APublication Date (Print):September 1, 1990Publication History Published online30 May 2012Published inissue 1 September 1990https://pubs.acs.org/doi/10.1021/ac00216a721https://doi.org/10.1021/ac00216a721research-articleACS PublicationsRequest reuse permissionsArticle Views588Altmetric-Citations19LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-Alertsclose Get e-Alerts