Microstructural Evolution Of Ti/Ni AND Ni/Ti Bilayer Thin Films

E. Haftek; Ming Tan; A. Waknis; J. A. Barnard

doi:10.1557/proc-238-701

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Microstructural Evolution Of Ti/Ni AND Ni/Ti Bilayer Thin Films

E. Haftek Ming Tan A. Waknis J. A. Barnard

Year: 1991 Journal: MRS Proceedings Vol: 238 Publisher: Cambridge University Press

DOI: 10.1557/proc-238-701

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Keywords:

Materials science Bilayer Amorphous solid Microstructure Transmission electron microscopy Annealing (glass) Crystallography Electron diffraction Intermetallic Thin film Metallurgy Composite material Nanotechnology Diffraction Alloy Membrane

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Metal and Thin Film Mechanics

Physical Sciences → Engineering → Mechanics of Materials

Copper Interconnects and Reliability

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Electrodeposition and Electroless Coatings

Physical Sciences → Engineering → Electrical and Electronic Engineering

Microstructural Evolution Of Ti/Ni AND Ni/Ti Bilayer Thin Films

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