JOURNAL ARTICLE
Enhanced field emission from density-controlled SiC nanowires
Year: 2008 Journal: Materials Chemistry and Physics Vol: 112 (1)Pages: 88-93 Publisher: Elsevier BV
Keywords:
Nanowire Materials science Field electron emission Transmission electron microscopy Raman spectroscopy Silicon carbide Scanning electron microscope High-resolution transmission electron microscopy Analytical Chemistry (journal) Non-blocking I/O Evaporation Field emission microscopy Graphite Spectroscopy Nanotechnology Chemical engineering Diffraction Catalysis Composite material Electron Optics Chemistry
Metrics
68
Cited By
3.42
FWCI (Field Weighted Citation Impact)
33
Refs
0.93
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Silicon Carbide Semiconductor Technologies
Physical Sciences → Engineering → Electrical and Electronic Engineering
ZnO doping and properties
Physical Sciences → Materials Science → Materials Chemistry
Carbon Nanotubes in Composites
Physical Sciences → Materials Science → Materials Chemistry
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