Model-Based Test Case Generation by Reusing Models From Runtime Monitoring of Deeply Embedded Systems
Padma IyengharJuergen WuebbelmannClemens WesterkampElke Pulvermueller
Abstract
This letter introduces a novel application of model-based runtime monitoring of deeply embedded systems. The proposed framework comprises of a minimally intrusive, generic, software-based, runtime monitoring methodology for visualizing the behavior of deeply embedded systems in real-time. The model-based runtime monitoring results are then reused for generating model-based test cases. A prototype implementation of the proposed framework is discussed along with examples.
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