JOURNAL ARTICLE
Near surface structure determination using X-ray reflection absorption spectroscopy
P. BorthenHans‐Henning Strehblow
Year: 1995 Journal: Physica B Condensed Matter Vol: 208-209 Pages: 421-422 Publisher: Elsevier BV
Keywords:
Reflection (computer programming) Optics Absorption (acoustics) Refraction Copper Layer (electronics) Refractive index Spectroscopy Spectral line Amplitude Materials science Fresnel equations Reflectivity Absorption spectroscopy Surface (topology) Physics Geometry Mathematics Nanotechnology
Metrics
10
Cited By
2.10
FWCI (Field Weighted Citation Impact)
2
Refs
0.87
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
X-ray Spectroscopy and Fluorescence Analysis
Physical Sciences → Physics and Astronomy → Radiation
X-ray Diffraction in Crystallography
Physical Sciences → Materials Science → Materials Chemistry
Pigment Synthesis and Properties
Physical Sciences → Chemistry → Inorganic Chemistry
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