Annealing dependence of optical and electrical properties of Ga8As46Te46 thin films

M.A. Abdel-Rahim

doi:10.1016/s0022-3697(98)00250-9

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Annealing dependence of optical and electrical properties of Ga8As46Te46 thin films

M.A. Abdel-Rahim

Year: 1999 Journal: Journal of Physics and Chemistry of Solids Vol: 60 (1)Pages: 29-39 Publisher: Elsevier BV

DOI: 10.1016/s0022-3697(98)00250-9

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Keywords:

Annealing (glass) Amorphous solid Materials science Electrical resistivity and conductivity Band gap Thin film Transmission electron microscopy Condensed matter physics Atmospheric temperature range Vacuum evaporation Thermal conduction Activation energy Analytical Chemistry (journal) Optoelectronics Composite material Chemistry Nanotechnology Crystallography Thermodynamics Electrical engineering

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Phase-change materials and chalcogenides

Physical Sciences → Materials Science → Materials Chemistry

Glass properties and applications

Physical Sciences → Materials Science → Ceramics and Composites

Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Annealing dependence of optical and electrical properties of Ga8As46Te46 thin films

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