JOURNAL ARTICLE

<title>Multiclass kernel-based feature extraction</title>

Yi ZhaoHonglin LiStanley C. Ahalt

Year: 2002 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 4730 Pages: 9-16   Publisher: SPIE

Abstract

Feature Extraction (FE) algorithms have attracted great attention in recent years. In order to improve the performance of FE algorithms, nonlinear kernel transformations (e.g., the kernel trick) and scatter matrix based class separability criteria have been introduced in Kernel-based Feature Extraction (KFE)\cite{}. However, for any L-class problem, at most L-1 nonlinear kernel features can be extracted by KFE, which is not desirable for many applications. To solve this problem, a modified kernel-based feature extraction (MKFE) based on nonparametric scatter matrices was proposed, but with the limitation of only being able to extract multiple features for 2-class problems. In this paper, we present a general MKFE algorithm for multi-class problems. The core of our algorithm is a novel expression of the nonparametric between-class matrix, which is shown to be consistent with the definition of the parametric between-class matrix in the sense of the scatter-matrix-based class separability criteria. Based on this expression of the between-class matrix our algorithm is able to extract multiple kernel features in multi-class problems. To speed up the computation, we also proposed a simplified formula. Experimental results using synthetic data are provided to demonstrate the effectiveness of our proposed algorithm.

Keywords:
Kernel (algebra) Kernel method Matrix (chemical analysis) Nonparametric statistics Feature extraction Algorithm Computer science Artificial intelligence Computation Pattern recognition (psychology) Kernel embedding of distributions Feature (linguistics) Class (philosophy) Support vector machine Variable kernel density estimation Parametric statistics Mathematics Discrete mathematics Statistics

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Topics

Face and Expression Recognition
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Image Processing Techniques and Applications
Physical Sciences →  Engineering →  Media Technology
Advanced Algorithms and Applications
Physical Sciences →  Engineering →  Control and Systems Engineering

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