JOURNAL ARTICLE

Noise characteristics of stacked CMOS active pixel sensor for charged particles

T. KunihiroK. NagashimaIsao TakayanagiJunichi NakamuraKoji KosakaHisayoshi Yurimoto

Year: 2001 Journal:   Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Vol: 470 (3)Pages: 512-519   Publisher: Elsevier BV
Keywords:
CMOS Noise (video) CMOS sensor Pixel Charged particle Materials science Optoelectronics Physics Optics Computer science Artificial intelligence Ion

Metrics

15
Cited By
1.10
FWCI (Field Weighted Citation Impact)
8
Refs
0.80
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

CCD and CMOS Imaging Sensors
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Particle Detector Development and Performance
Physical Sciences →  Physics and Astronomy →  Nuclear and High Energy Physics
Advanced Memory and Neural Computing
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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