JOURNAL ARTICLE

Exciton localization in MgxZnyCd1−xySe alloy

Abstract

Abstract We report photoluminescence and reflectivity measurements of Mg x Zn y Cd 1− x − y Se epitaxial layers (0 < x < 0.53) grown by molecular beam epitaxy on InP (100) substrates. Significant emission line broadening, increase in activation energy and Stokes shift are monitored with increasing Mg content. For Mg x Cd y Zn 1− x − y Se samples with large Mg content ( x > 0.3), we observe an anomalous temperature dependence of both the emission energy and line broadening. This behavior is assigned to the emission from localized states. Different mechanisms of carrier localization are discussed and exciton localization on statistical CdSe clusters is proposed to be the most likely one. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

Keywords:
Photoluminescence Exciton Epitaxy Molecular beam epitaxy Alloy Analytical Chemistry (journal) Line (geometry) Emission spectrum Activation energy Chemistry Content (measure theory) Stokes shift Materials science Crystallography Condensed matter physics Physics Spectral line Luminescence Physical chemistry Nanotechnology Optoelectronics Metallurgy

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Topics

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