JOURNAL ARTICLE

Two-wavelength contouring in difference holographic interferometry and DISCO

F. Gyı́mesiZ. FüzessyB. RáczkeviVencel Borbely

Year: 2004 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 5457 Pages: 538-538   Publisher: SPIE

Abstract

The first two-wavelength contouring method of difference holographic interferometry (DiffHI) has been developed - as a more sensitive and more user-friendly alternative to the already existing two-refractive-index contouring method of DiffHI. It is built on "compensation-friendly" two-wavelength contouring method and on its tilt compensation version, developed specially for this purpose. Experimental verification is presented for the numerically correct functioning of the two-wavelength contouring method of DiffHI - although it is limited temporarily to mirror objects, only, because of intensity problems of the available laser. However, we hope to get the same results on diffuse objects, too - just in the near future. Two ideas seem to be applicable in the digital holographic version of the two-wavelength contouring method of DiffHI and subsequently in the Distant Shape Control project (DISCO), too. The first one is the application of the extra adjustment-monitoring mirror surface to control alignment accuracies in holographic illuminations and in remote duplication of the optical arrangement. The second one is the tilt compensation process which can correct the previous inaccuracies. The first one, on the other hand, can be used for the control of the accuracy of the calculated reference direction change, as well - at contouring with non-holographic illumination, too.

Keywords:
Contouring Holography Optics Holographic interferometry Wavelength Compensation (psychology) Interferometry Electronic speckle pattern interferometry Computer science Process (computing) Tilt (camera) Physics Mathematics Computer graphics (images)

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Citation History

Topics

Optical measurement and interference techniques
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Advanced Measurement and Metrology Techniques
Physical Sciences →  Engineering →  Mechanical Engineering
Optical Systems and Laser Technology
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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