Preparation and characterization of amorphous ZrF4 thin films

Rui M. Almeida; Paulo Morais

doi:10.1016/0022-3093(95)00089-5

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Preparation and characterization of amorphous ZrF4 thin films

Rui M. Almeida Paulo Morais

Year: 1995 Journal: Journal of Non-Crystalline Solids Vol: 184 Pages: 93-97 Publisher: Elsevier BV

DOI: 10.1016/0022-3093(95)00089-5

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Keywords:

Amorphous solid Materials science Thin film Refractive index Wafer Infrared spectroscopy Absorption spectroscopy Characterization (materials science) Absorption (acoustics) Vacuum evaporation Amorphous silicon Evaporation Analytical Chemistry (journal) Optics Silicon Diffraction Infrared Vacuum deposition Spectroscopy Composite material Crystallography Crystalline silicon Optoelectronics Chemistry Nanotechnology Organic chemistry

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Glass properties and applications

Physical Sciences → Materials Science → Ceramics and Composites

Advanced ceramic materials synthesis

Physical Sciences → Materials Science → Ceramics and Composites

Inorganic Fluorides and Related Compounds

Physical Sciences → Chemistry → Inorganic Chemistry

Preparation and characterization of amorphous ZrF4 thin films

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