JOURNAL ARTICLE

Formation of ferroelectric thin films on ruthenium electrodes

Takehiko SatoKazuyuki SugaharaTakeshi KijimaHiroshi Ishiwara

Year: 2001 Journal:   Integrated ferroelectrics Vol: 39 (1-4)Pages: 169-177   Publisher: Taylor & Francis

Abstract

Abstract Sr0.8Bi2.4Ta2O9 (SBT) and Bi3.25+xLa0.75Ti3O12 (BLT) films were prepared on Ru electrodes by a sol-gel spin-coating method. It was found in the case of SBT/Ru that the oxidation of Ru was suppressed by annealing at temperatures lower than 650°C in O2 atmosphere or by annealing lower than 700°C in N2. However, the remanent polarization values of the films were as low as 2.3 μC/cm2 (2Pr) for the former case and 4.4 μC/cm2 for the latter case. On the other hand, the BLT/Ru samples crystallized at 650°C showed good crystallinity without oxidation of the Ru electrode. It was found that the ferroelectric properties depended on the amount of excess-Bi sensitively, and the film prepared under the optimum Bi composition showed an excellent P-V hysteresis loop with 2 Pr of 25 μC/cm2.

Keywords:
Materials science Crystallinity Ferroelectricity Annealing (glass) Electrode Spin coating Thin film Polarization (electrochemistry) Sol-gel Ruthenium Analytical Chemistry (journal) Nanotechnology Composite material Optoelectronics Dielectric Physical chemistry Catalysis

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Ferroelectric and Piezoelectric Materials
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Multiferroics and related materials
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