Electronic structure of CeCo2 thin films studied by X-ray absorption spectroscopy

Chung‐Li Dong; K. Asokan; Y.Y. Chen; Chi‐Liang Chen; J.L. Chen; Y.S. Liu; Jin‐Seok Lee; J.-H. Guo; C. L. Chang

doi:10.1016/j.physb.2007.10.057

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Electronic structure of CeCo2 thin films studied by X-ray absorption spectroscopy

Chung‐Li Dong K. Asokan Y.Y. Chen Chi‐Liang Chen J.L. Chen Y.S. Liu Jin‐Seok Lee J.-H. Guo C. L. Chang

Year: 2007 Journal: Physica B Condensed Matter Vol: 403 (5-9)Pages: 854-855 Publisher: Elsevier BV

DOI: 10.1016/j.physb.2007.10.057

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Keywords:

XANES Valence (chemistry) Thin film Materials science Ion Analytical Chemistry (journal) Absorption spectroscopy Spectral line Electronic structure Spectroscopy Absorption (acoustics) Absorption edge Molecular physics Chemistry Optics Band gap Optoelectronics Nanotechnology Physics Computational chemistry

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Rare-earth and actinide compounds

Physical Sciences → Physics and Astronomy → Condensed Matter Physics

Magnetic and transport properties of perovskites and related materials

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Magnetic Properties of Alloys

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Electronic structure of CeCo2 thin films studied by X-ray absorption spectroscopy

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