JOURNAL ARTICLE

Exchange induced unidirectional anisotropy at FeMn-Ni80Fe20 interfaces

C. TsangNeil HeimanKenneth Lee

Year: 1981 Journal:   Journal of Applied Physics Vol: 52 (3)Pages: 2471-2473   Publisher: American Institute of Physics

Abstract

We have systematically investigated exchange coupled films of sputter deposited Ni80Fe20/FeMn and FeMn/Ni80Fe20 and obtained films with high exchange bias and low coercive forces. The variation of film properties with deposition conditions as well as with the permalloy and FeMn thicknesses have also been studied. The results demonstrated a strong dependence of exchange bias effect (HUA) on the amount of γ-phase FeMn, the amount of impurities, as well as the abruptness of the transition profile at the interface. In addition, our results have also raised a number of new questions concerning the magnetic state of the interface and the origin of the interface coupling phenomena.

Keywords:
Permalloy Materials science Condensed matter physics Coercivity Exchange bias Sputtering Impurity Coupling (piping) Deposition (geology) Magnetic anisotropy Phase (matter) Anisotropy Thin film Magnetization Metallurgy Nanotechnology Magnetic field Chemistry Physics

Metrics

205
Cited By
1.21
FWCI (Field Weighted Citation Impact)
4
Refs
0.75
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Magnetic properties of thin films
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Magnetic Properties and Applications
Physical Sciences →  Materials Science →  Electronic, Optical and Magnetic Materials
Metallic Glasses and Amorphous Alloys
Physical Sciences →  Engineering →  Mechanical Engineering

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