Optical characterization of extremely high purity ZnSe grown by metal-organic vapour phase epitaxy using dimethylzinc-triethylamine adduct

Thierry Cloître; N. Briot; O. Briot; Bernard Gil; R.L. Aulombard; Anthony C. Jones

doi:10.1016/0921-5107(93)90341-j

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Optical characterization of extremely high purity ZnSe grown by metal-organic vapour phase epitaxy using dimethylzinc-triethylamine adduct

Thierry Cloître N. Briot O. Briot Bernard Gil R.L. Aulombard Anthony C. Jones

Year: 1993 Journal: Materials Science and Engineering B Vol: 21 (2-3)Pages: 169-173 Publisher: Elsevier BV

DOI: 10.1016/0921-5107(93)90341-j

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Keywords:

Dimethylzinc Triethylamine Adduct Phase (matter) Epitaxy Materials science Characterization (materials science) Metal Chemistry Organic chemistry Catalysis Nanotechnology

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Chalcogenide Semiconductor Thin Films

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor Quantum Structures and Devices

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Quantum Dots Synthesis And Properties

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Optical characterization of extremely high purity ZnSe grown by metal-organic vapour phase epitaxy using dimethylzinc-triethylamine adduct

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