JOURNAL ARTICLE

Surface Evaluation of LiNbO3, LiTaO3 Crystals Etched Using Fluorine System Gas Plasma RIE

Takahiro FujiiShinzo Yoshikado

Year: 2003 Journal:   IEEJ Transactions on Fundamentals and Materials Vol: 123 (8)Pages: 731-737   Publisher: Institute of Electrical Engineers of Japan

Abstract

Etching characteristic LiNbO3 and LiTaO3 single crystals has been investigated using plasma RIE with mixture gases of CF4/Ar, CF4/H2, CF4/Ar/H2. The etched surface was evaluated by means of atomic force microscopy and X-ray diffraction methods. The in situ surface temperature of the sample during RIE was measuresd. F atoms exist in the contamination layer, such as sediments, on the surface etched using the mixture gases of CF4, Ar and H2 gases. The etch rate was dependent on the orientation of a crystal. The etch rate of LiTaO3 was less than that of LiNbO3.

Keywords:
Etching (microfabrication) Plasma Fluorine Layer (electronics) Materials science Analytical Chemistry (journal) Diffraction Crystal (programming language) Plasma etching Surface layer Lithium tantalate Chemistry Optics Nanotechnology Optoelectronics Lithium niobate Chromatography Metallurgy

Metrics

3
Cited By
0.31
FWCI (Field Weighted Citation Impact)
5
Refs
0.61
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Plasma Diagnostics and Applications
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Optical Coatings and Gratings
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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